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20TH INTERNATIONAL CONFERENCE ON NON-CONTACT ATOMIC FORCE MICROSCOPY

Country : China

City : Suzhou

Start Date : 2017/09/25

End Date : 2017/09/29

Website : http://ncafm2017.csp.escience.cn/dct/page/1

DESCRIPTION
  • Novel Instrumentation and techniques in AFM
  •  Atomic resolution imaging on insulating substrates, semiconductors, and metals
  • High-resolution imaging of molecules, clusters and biological systems
  •  Atomic- and molecular-scale manipulation
  •  Simultaneous force and tunneling spectroscopy
  • High-resolution imaging and spectroscopy in liquid environments
  • Theoretical analysis of contrast mechanisms; forces & tunneling phenomena
  • 2D and 3D force-field mapping
  • Small amplitude and lateral force measurements using dynamic methods
  •  Mechanisms and understanding of damping and energy dissipation
  • Nanoscale measurements of charges, work function, and magnetic properties
  • Theoretical aspects of Scanning Probe Techniques