This Technical Specifiation provides methods for the determination of residual elements other than carbon
in samples of single-wall carbon nanotubes (SWCNTs) and multiwall carbon nanotubes (MWCNTs) using
inductively coupled plasma mass spectrometry (ICP-MS).
The purpose of this Technical Specifiation is to provide optimized digestion and preparation procedures
for SWCNT and MWCNT samples in order to enable accurate and quantitative determinations of elemental
impurities using ICP-MS.