Nanomanufacturing – Key control characteristics – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method

Nanomanufacturing – Key control characteristics – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method

Standard Number PD IEC/TS 62607-6-16 Ed.1.0
Organization British Standards Institution UK
Level National
Category Test Method | Characterization | Measurement
Status
  • JUN 2019 Under Drafting