Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Standard Number DIN SPEC 52407:2015-03
Organization German institute for standardization Germany
Level National
Category Test Method | Characterization | Measurement
Status
  • MAR 2015 Published