Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic Force Microscopy

Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic Force Microscopy

Standard Number IEC TS 62607-9-1 ED1
Organization International Electrotechnical Commission World
Level International
Category Test Method | Characterization | Measurement
Status
  • AUG 2021 Under Approval