Nanomanufacturing – Key control characteristics – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method

Nanomanufacturing – Key control characteristics – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method

Standard Number IEC TS 62607-6-16 ED1
Organization International Electrotechnical Commission World
Level International
Category Test Method | Characterization | Measurement
Status
  • FEB 2021 Under Development