IEC TS 62876-4-x , Nanomanufacturing – Reliability assessments– Part 4-x: Quantum dot materials used in Q-LCFs

IEC TS 62876-4-x , Nanomanufacturing – Reliability assessments– Part 4-x: Quantum dot materials used in Q-LCFs

Standard Number PWI 113-126
Organization International Electrotechnical Commission World
Level International
Category Test Method | Characterization | Measurement
Status
  • NOV 2019 Under Drafting