Nanotechnologies – Assessment of thickness, density and interface width of single- and multi-layer nanofilms by X-ray reflectometry (XRR)- Test method

Nanotechnologies – Assessment of thickness, density and interface width of single- and multi-layer nanofilms by X-ray reflectometry (XRR)- Test method

Organization Institute of Standards and Industrial Research of Iran Iran
Level National
Category Test Method | Characterization | Measurement
Status
  • MAR 2020 Published