Nanotechnologies — Assessment of thickness, density and interface width of single- and multi-layer nanofilms by X-ray reflectometry (XRR) — Test method

Nanotechnologies — Assessment of thickness, density and interface width of single- and multi-layer nanofilms by X-ray reflectometry (XRR) — Test method

Link To Website
Standard Number INSO 22781
Organization Institute of Standards and Industrial Research of Iran Iran
Level National
Category Test Method | Characterization | Measurement
Status
  • MAR 2020 Published