Scanning probe microscope-Method for lateral force microscope

Scanning probe microscope-Method for lateral force microscope

Standard Number KS D 2714
Organization Korean Agency for Technology and Standards South Korea
Level National
Category Specification
Status
  • DEC 2006 Published
  • DEC 2016 Revised
ABSTRACT
This standard specifies a method for measuring the lateral transverse lateral force using the transverse lateral force microscope function of a scanning probe microscope. This method specifies the horizontal lateral force measurement in a scanning probe microscope.