Research & Science NEWS

Capturing Ultrafast Light-induced Phenomena on the Nanoscale: Development of a Novel Time-resolved Atomic Force Microscopy Technique

2024-02-06

Capturing Ultrafast Light-induced Phenomena on the Nanoscale: Development of a Novel Time-resolved Atomic Force Microscopy Technique

Researchers at University of Tsukuba have successfully developed a new time-resolved atomic force microscopy (AFM) technique, integrating AFM with a unique laser technology. This method enables the measurement of ultrafast photoexcitation phenomena in both conductors and insulators, observed through changes in the forces between the sample and the AFM probe tip after an extremely short time...