Standard Guide for Characterization of Graphene Flakes
| Standard Number | ASTM E3220-20 |
|---|---|
| Organization |
American Society for Testing and Materials
|
| Level | National |
| Category | Guide | Practice |
| Status |
|
ABSTRACT
This standard will provide guidance on the measurement approaches for assessment of lateral flake size, average flake thickness, Raman intensity ratio of the D to G bands, and carbon/oxygen ratio for graphene and related products. The techniques included here are atomic force microscopy, Raman spectroscopy and X-ray photoelectron spectroscopy. Examples will be given for each type of measurement.