Nanomanufacturing - Key control characteristics-– Part 06-27: Two-dimensional materials - Field-effect mobility: 4-Point Probe Field-Effect Transistor method
| Standard Number | PD IEC/TS 62607-6-27 |
|---|---|
| Organization |
British Standards Institution
|
| Level | National |
| Category | Test Method | Characterization | Measurement |
| Status |
|