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Nanomanufacturing. Key control characteristics. 2D material-related products. Schottky barrier heights of 2D material based field-effect transistors: temperature-dependent current-voltage measurements

Link To Website
Standard Number PD IEC TS 62607-12-3:2026
Organization British Standards Institution
Level National
Category Test Method | Characterization | Measurement
Status
  • JUN 2026 Published