State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractomete

This standard specifies a procedure for performing the following measurements using an automatic small-angle X-ray diffractometer:

- maximum sizes and electron radii of gyration of nanoparticles in monodisperse systems in the range from 1 to 100 nm;

- nanoparticle size distribution in polydisperse systems in the range from 1 to 100 nm;

- total thickness and size of the layer repetition period in multilayer films with a thickness from 1 to 100 nm.

This standard applies to:

- materials containing systems of nanoparticles with an arithmetic mean distance between them of at least 10 maximum linear dimensions, with a uniform electron density, greater or less than the electron density of the environment;

- multilayer films with a known number of identical groups of layers, produced on solid flat substrates