Nanotechnologies. Reliability assessment. Part 2-1. Nano-enabled photovoltaic devices. Test methods for resistance to external factors

This standard applies to nanotechnology photovoltaic devices (NPMTs) and establishes test methods for their resistance to external factors to assess reliability. This standard applies to NPMTs used as elements for the fabrication of photovoltaic modules in combination with other elements. This standard establishes standard test conditions and a methodology for reporting data for assessing the reliability of NPMTs and the stability of technological processes. The test results determine the stability of characteristics under standard degradation conditions to quantitatively assess the stability of the new technological process. The procedures established in this standard were developed for NPMTs but can be applied to other photovoltaic products and technological processes.