Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

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Standard Number	IEC TS 62607-6-11:2022
Organization	International Electrotechnical Commission
Level	International
Category	Test Method \| Characterization \| Measurement
Status	MAR 2022 Published

ABSTRACT

IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic
• defect density nD
of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by
• Raman spectroscopy