IEC TS 62607-8-4 Nanomanufacturing - Key Control Characteristics - Part 8-4: Nano-enabled metal-oxide interfacial devices - Test method for electronic trap states by low-frequency-noise spectroscopy
| Standard Number | IEC TS 62607-8-4 |
|---|---|
| Organization |
International Electrotechnical Commission
|
| Level | International |
| Category | Test Method | Characterization | Measurement |
| Status |
|
ABSTRACT
This part of IEC 62607 focuses on a measurement protocol to evaluate the electronic trap states by low-frequency-noise spectroscopy in nano-enabled metal-oxide interfacial devices. This part of IEC 62607 includes: – outlines of the experimental procedures used to measure resistance change, – methods to evaluate the activation energy of the electronic trap states