Nanomanufacturing - Key control characteristics - Part 12-01: 2D material-related products - Density of interface traps: I-V curve analysis of field effect transistors
| Standard Number | IEC TS 62607-12-01 |
|---|---|
| Organization |
International Electrotechnical Commission
|
| Level | International |
| Category | Test Method | Characterization | Measurement |
| Status |
|