☰
✕

IEC TS 62607-x-y: Nanomanufacturing - Key control characteristics - Part X-X: Graphene-related products - Twist angle in bilayer graphene: Raman spectroscopy

Link To Website
Standard Number PWI 113-176
Organization International Electrotechnical Commission
Level International
Category Test Method | Characterization | Measurement
Status
  • DEC 2025 Under Drafting
ABSTRACT

This part of 62607 establishes a standardized method to determine the structural key control characteristic

•    twist angle    for bilayer graphene systems like naturally stacked and artificially twisted bilayer graphene by

•   Raman spectroscopy method