IEC TS 62607-X-X, Nanomanufacturing – Key control characteristics – Part X-X: Thermal control interfacial devices – Thermal conductivity: Frequency-Domain Thermoreflectance techniques
| Standard Number | PWI 113-182 |
|---|---|
| Organization |
International Electrotechnical Commission
|
| Level | International |
| Category | Specification |
| Status |
|
ABSTRACT
This part of IEC TS 62607 specifies a measurement protocol to determine the key control characteristic – Thermal conductivity for thermal control interfacial devices by – Frequency-Domain Thermoreflectance Techniques (FDTR).