Nanotechnologies — Structural characterization of graphene oxide flakes — Thickness and lateral size measurement using atomic force microscopy and scanning electron microscopy
| Standard Number | ISO/DTS 23879 |
|---|---|
| Organization |
International Organization for Standardization
|
| Level | International |
| Category | Test Method | Characterization | Measurement |
| Status |
|
ABSTRACT
This document describes methods for measuring the lateral size and thickness of graphene oxide (GO) flakes using scanning electron microscopy (SEM) and atomic force microscopy (AFM) respectively, including sample pre-treatments, measurement procedures and data analysis. It is applicable to the characterization of graphene oxide in powder and liquid dispersion forms.