Scanning probe microscope-Method for lateral force microscope
Standard Number | KS D 2714:2006 |
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Organization |
Korean Agency for Technology and Standards
|
Level | National |
Category | Specification |
Status |
|
ABSTRACT
This standard specifies a method for measuring the lateral transverse lateral force using the transverse lateral force microscope function of a scanning probe microscope. This method specifies the horizontal lateral force measurement in a scanning probe microscope.