Nanofabrication — Key Control Characteristics — Part 5-3: Thin-Film Organic/Nanoelectronic Devices — Charge Carrier Concentration Measurements
| Standard Number | KS C IEC TS 62607-5-3: 2025 |
|---|---|
| Organization |
Korean Agency for Technology and Standards
|
| Level | National |
| Category | Test Method | Characterization | Measurement |
| Status |
|
ABSTRACT
This standard applies to sample structures for evaluating a wide range of charge carrier concentrations in organic and nanomaterials. It also applies to both capacitance-voltage (CV) measurements in metal/insulator/semiconductor stacked structures and Hall effect measurements in van der Pauw configurations. This standard also presents criteria for selecting methods for measuring charge carrier concentrations in organic semiconductor layers.