Nanofabrication—Key Control Characteristics—Part 6-2: Graphene—Layer Count: Atomic Force Microscopy, Optical Transmission, and Raman Spectroscopy
| Standard Number | KS C IEC TS 62607-6-2: 2025 |
|---|---|
| Organization |
Korean Agency for Technology and Standards
|
| Level | National |
| Category | Test Method | Characterization | Measurement |
| Status |
|
ABSTRACT
This standard provides standardized methods for measuring the following key control characteristics:
— A combination of the following methods for layer-count graphene flakes:
— Atomic force microscopy;
— Optical transmission microscopy;
— Raman spectroscopy