General rules for nanometer-scale length measurement by SEM
| Standard Number | GB/T 20307-2006 |
|---|---|
| Organization |
Standardization Administration of China
|
| Level | National |
| Category | Specification |
| Status |
|
ABSTRACT
This standard specifies the basic principles of nanoscale length measured with scanning electron microscopy (sem). Suitable for measuring the 10 nm - 500 nm point or line spacing.