Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
Standard Number | GB/T 20725-2006 |
---|---|
Organization |
Standardization Administration of China
|
Level | National |
Category | Guide | Practice |
Status |
|
ABSTRACT
ISO 17470:2014 gives guidance for the identification of elements and the investigation of the presence of specific elements within a specific volume (on a μm3 scale) contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.