Nanotechnology -- Measurement of defect concentration of graphene -- Raman spectroscopy method
Standard Number | GB/T 43341-2023 |
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Organization |
Standardization Administration of China
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Level | National |
Category | Test Method | Characterization | Measurement |
Status |
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ABSTRACT
This document describes the method of measuring graphene defect concentration using Raman spectroscopy, including principles, instrument parameter requirements, sample preparation, and test testing steps and data analysis and processing:
This document is applicable to the point defect concentration measurement of single-layer graphene with a lateral size of not less than 2 μm, uniform physical properties, and clean surface.