Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
Standard Number | NEK IEC TS 62876-2-1: 2018 |
---|---|
Organization |
Standards Norway
|
Level | National |
Category | Test Method | Characterization | Measurement |
Status |
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ABSTRACT
IEC TS 62876-2-1: 2018 establishes a general stability testing program to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing program defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.