Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic / nano electronic devices - Measurements of charge carrier concentration
Standard Number | NEK IEC TS 62607-5-3: 2020 |
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Organization |
Standards Norway
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Level | National |
Category | Test Method | Characterization | Measurement |
Status |
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ABSTRACT
IEC TS 62607-5-3: 2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic / nano materials. This specification is provided for both capacitance-voltage (CV) measurements in metal / insulator / semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.