Cryogenic on-wafer prober determines quality of qubit devices for quantum computing and quantum sensing
Date | 31st, Aug 2023 |
---|---|
Source | Phys.org - Scientific News Websites |
DESCRIPTION
Germany's first cryogenic measuring setup for statistical quality measurement of qubit devices on whole 200- and 300-mm wafers has started operation at Fraunhofer IAF. The on-wafer prober can characterize devices based on semiconductor quantum dots and quantum wells as well as superconductors at measurement temperatures below 2 K.