Capturing ultrafast light-induced phenomena on the nanoscale: development of a novel time-resolved atomic force microscopy technique

Researchers have successfully developed a new time-resolved atomic force microscopy (AFM) technique, integrating AFM with a unique laser technology. This method enables the measurement of ultrafast photoexcitation phenomena in both conductors and insulators, observed through changes in the forces between the sample and the AFM probe tip after an extremely short time irradiation of laser light. This advancement promises substantial contributions to the creation of new scientific and technological principles and fields.