Smart data enhances atomic force microscopy
Date | 16th, Nov 2018 |
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Source | EurekAlert - Scientific News Websites |
DESCRIPTION
In this work, researchers use scanning probe microscopy (SPM) as an example to demonstrate deep data methodology for nanosciences, transitioning from brute-force analytics such as data mining, correlation analysis and unsupervised classification to informed and/or targeted causative data analytics built on sound physical understanding.