Measurement of semiconductor material quality is now 100,000 times more sensitive
Date | 11th, Apr 2019 |
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Source | chemeurope.com - Scientific News Websites |
DESCRIPTION
The enhanced power of the new measuring technique to characterize materials at scales much smaller than any current technologies will accelerate the discovery and investigation of 2D, micro- and nanoscale materials.
Being able to accurately measure semiconductor properties of materials in small volu...