Looking inside 3D silicon nanostructures without leaving a trace: 'the Good, the Bad, the Ugly'

Scientists have discovered a new method to non-destructively look inside three-dimen­sional (3D) nanostructures without breaking them. The study is timely since 3D nanostruc­tures are drawing a fast-growing attention for their advanced functionalities in nanopho­tonics, photovoltaics, 3D integrated circuits, and flash memories.