New method gives robust transistors: Transmorphic epitaxial growth of AlN nucleation layers on SiC substrates for high-breakdown thin GaN transistors
| Date | 7th, Jan 2020 |
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| Source | ScienceDaily - General News Websites |
DESCRIPTION
A new method to fit together layers of semiconductors as thin as a few nanometers has resulted in not only a scientific discovery but also a new type of transistor for high-power electronic devices.