New method gives robust transistors: Transmorphic epitaxial growth of AlN nucleation layers on SiC substrates for high-breakdown thin GaN transistors

Date 7th, Jan 2020
Source ScienceDaily - General News Websites

DESCRIPTION

A new method to fit together layers of semiconductors as thin as a few nanometers has resulted in not only a scientific discovery but also a new type of transistor for high-power electronic devices.