Atomic-Scale Imaging Reveals Strength Capabilities of Thin Film
| Date | 18th, Mar 2020 |
|---|---|
| Source | Photonics Media - Scientific News Websites |
DESCRIPTION
Researchers at the University of Minnesota have used high-resolution TEM microscopy to image the atomic structure of ultrathin zeolite nanosheets, which are used by industries as specialized molecular filters. The researchers observed one-dimensional defects in a two-dimensional structure of porous zeolite called MFI. By imaging the atomic structure of MFI nanosheets at such an extraordinary level of detail, they were able to discern that these one-dimensional defects resulted in a reinforced nanosheet structure that changed the filtration properties of the nanosheet significantly. The minute differences were detected by researcher Prashant Kumar. “After staring at noisy images in the TEM for countless hours, I finally saw...