Developing new techniques to improve atomic force microscopy
| Date | 30th, Jun 2020 |
|---|---|
| Source | chemeurope.com - Scientific News Websites |
DESCRIPTION
Researchers at the Beckman Institute for Advanced Science and Technology have developed a new method to improve the detection ability of nanoscale chemical imaging using atomic force microscopy. These improvements reduce the noise that is associated with the microscope, increasing the precision and ...