Researchers realize nanoscale electrometry based on magnetic-field-resistant spin sensors

A team led by Prof. Du Jiangfeng, Prof. Shi Fazhan, and Prof. Wang Ya from University of Science and Technology of China, of the Chinese Academy of Sciences, proposed a robust electrometric method utilizing a continuous dynamic decoupling technique, where the continuous driving fields provide a magnetic-field-resistant dressed frame. The study was published in Physical Review Letters on June 19.