Focused Ion Beam: a 'tool' for micro/nano fabrication and characterization – Physics World
| Date | 1st, Feb 2021 |
|---|---|
| Source | Physics World - Nanotechnology Websites |
DESCRIPTION
Join the audience for a live webinar on 24 February 2021 sponsored by Hiden Analytical and Agilent Technologies, in partnership with IUVSTA
The post Focused Ion Beam: a ‘tool’ for micro/nano fabrication and characterization appeared first on Physics World.