Researchers demonstrate label-free super-resolution microscopy: Imaging method measures particle size and position with nanometer precision

Researchers describe a new measurement and imaging approach that can resolve nanostructures smaller than the diffraction limit of light without requiring any dyes or labels. The work is a modification of laser scanning microscopy. It represents an important advance toward a new and powerful microscopy method that could be used to see the fine features of complex samples beyond what is possible with conventional microscopes and techniques.