Researchers develop novel 3D atomic force microscopy probes: Advancement paves the way for a range of potential AFM novel applications and nano-scale discoveries

A team of researchers has developed new kind of Atomic Force Microscopy (AFM) probes in true three-dimensional shapes they call 3DTIPs. AFM technology allows scientists to observe, measure, and manipulate samples and micro and nanoscale entities with unprecedented precision. The new 3DTIPs, which are manufactured using a single-step 3D printing process, can be utilized for a wider variety of applications -- and potential observations and discoveries -- than standard, more limited silicon-based probes that are considered state-of-the-art in our current time.