Application of Piezoresponse Force Microscopy for Electromechanical Measurements
| Date | 13th, Oct 2022 |
|---|---|
| Source | AZoNano - Nanotechnology Websites |
DESCRIPTION
Piezoresponse force microscopy (PFM) is a powerful technique used to characterize nanoscale properties in electromechanically active materials, such as ferroelectrics and multiferroics.