Blue Light Technique Will Advance Nanoscale Tech

Researchers at Brown University have developed an approach to scattering-type scanning near-field microscopy (s-SNOM) that uses blue light to enable measurement of electrons in semiconductors, as well as other nanoscale materials. The findings, which the researchers said are a first in nanoscale imaging, provide a workaround to a long-standing problem that has limited the study of key phenomena in a variety of materials that could one day lead to more energy-efficient semiconductors and electronics.