Location | China - Xi'an |
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Start Date | Aug 2, 2021 |
End Date | Aug 6, 2021 |
Event Type | Conference |
Subject Area | NMES - MEMS Nanometrology Nanofabrication - Characterization Nanoscience - Nanotechnology |
3M-NANO is the annual International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale; it will be held on 2-6 August 2021 in Xi'an, China. The ultimate ambition of this conference series is to bridge the gap between nanosciences and engineering sciences, aiming at technology opportunities and new markets. The advanced technologies for manipulation, manufacturing and measurement at nanoscale promise novel revolutionary products and methods in numerous areas of application. Scientists working in research fields related to 3M-NANO topics are invited to submit papers. All accepted full papers (presented at the conference and following IEEE format) will be submitted in IEEE Xplore database and Ei Compendex. Selected papers will be recommended for publication in the IEEE Trans. on Automation Science & Engineering, Int. J of Nanomanufacturing, IFAC Mechatronics, Int. J of Optomechatronics, J of Micro-Bio Robotics, Journal of Bionic Engineering, Light (Science & Applications), Optics and Precision Engineering, Micromachines, International Journal of Extreme Manufacturing and Material Today Bio and other SCI/EI journals.
Topice:
- Nanohandling robots and systems
- Nanofabrication and nanoassembly
- Nanometrology and nanocharacterization
- Nanopositioning and nanomanipulation
- Nanosensing and microscopy
- AFM and SEM for nanohandling
- Process automation at nanoscale
- Self-assembly at nanoscale
- Nanoscale robotics
- Nanolithography
- Nanoenergy
- 2D Materials
- Nanomaterials and applications
- Graphene and applications
- Nanoparticles, nanowires and nanotubes
- Nanoelectronics and nanomagnetics
- Nanophotonics and photonic crystals
- Nanomechanics and nanomechatronics
- NEMS and their applications
- Nanofluidics
- DNA detection and sequencing
- Bio-nano devices and applications
- Bio-nanoimaging and nanomeasurement