IEEE International Conference on Design & Test of Integrated Micro & Nano-Systems (DTS)

The IEEE international conference on Design & Test of integrated micro & nano-Systems represents a scientific and technological event dedicated to integrated electronic systems which reach the nanoscale era. The interests of the conference cover all the aspects from the design to the test of micro and nano systems.

IEEE DTS is an important meeting where well known researchers from universities and companies will present the latest innovations in the field of micro and nano electronics. It will be also an opportunity for researchers to present and discuss their latest work. IEEE DTS’22 will be organized by the Germain International University (GIU), Egypt. The conference official language is English.

Topics:

Systems Design & Technology :

- Analog, digital, mixed, and RF circuits design
- SoC, MPSoC, NoC, SIP, and NIP design
- Embedded electronics and System architecture
- MEMS, NEMS and MOEMS systems design
- Low-power electronics and systems design
- Sensory Systems Design
- Wireless communication systems design
- Opto-electronic System Design
- Biomedical Circuit & Systems
- Bio-engineering & Bio-chip design
- Linear & Non-Linear Circuits
- Power electronics and systems design
- Hardware co-design & FPGA design
- VLSI systems circuit and design
- DSPs and multiprocessor systems
- Embedded systems for Deep Learning
- Control Systems & Mechatronics
- Algorithms, methods and tools for modeling, simulation, synthesis and verification of ICs
- Algorithms, methods and tools for signal processing and image processing
- Algorithms, methods and tools for information security and cryptography
- Artificial Intelligence systems
- Electronic systems for energy harvesting applications
- GPS based engineering systems
- Process technologies, CMOS, BiCMOS, GaAs
- Microwave Systems & Integrated antenna
- 3D integration design and analysis
- ICs packaging

Systems Testing & Reliability:

- Analog, digital, mixed, and RF circuits testing
- SoC, MPSoC, NoC, SIP, and NIP test
- On-line Testing and fault Tolerance
- Defect and Fault Modeling
- MEMS, NEMS and MOEMS Testing
- 3D testing
- Delay testing
- DFT, BIST and BISR
- Fault Simulation, ATPG
- Yield Optimization
- Memory & FPGA Test and Repair
- Automotive reliability and test
- Reliability failures and modeling
- Electronic System Reliability
- Test and Security Issues
- ATE issues
- Alternatives test strategies

Nanotechnology and applications:

- Nanomaterials and applications: Nanostructured / nanoporous Materials and devices, Carbon Nanostructures and devices, Polymer Nanotechnology and devices...
- Nanoscale Materials/devices Characterization and modeling
- Nanoelectronics: Nano-circuits and Nano-architectures,
- Microfluidics and Nanofluidics Systems
- Nano-sensors for environmental monitoring
- Nanotechnology for health care and diagnosis: BioMEMS and BioNEMS, Lab On chips and Biosensors, Implantable micro/nano systems,..
- Nano/micro Technologies based Energy harvesting and storage devices and microsystems: Renewable and Novel Energy harvesting  approaches (innovative solar cells, piezolectric and thermoelectric mircosources), Energy storage devices and applications (fuel cells, supercapacitors etc..)
- Nanorobotics and Nano-manipulation

VLSI IoT Devices:

- Ultra-low power VLSI design for IoT
- System on Chip for IoTs
- IoT Application oriented Technologies
- IoT communication systems
- Real-time IoT systems
- RFID systems
- IoT Services and Applications
- IoT nodes architectures
- Sensors and Actuators for IoT
- Power and Energy systems design for IoT nodes
- Connectivity for IoT
- Computing Platforms for IoT
- Data Acquisition, Storage and Management for IoT
- Security and Privacy Enhancing Technologies for IoT devices
- IoT System Interfaces
- Reliability of IoT VLSI