This document provides guidelines for the characterization of single-walled carbon nanotubes (SWCNT) using near-infrared photoluminescence (PL) spectroscopy. infrared (NIR). It provides a method for determining the chiral indices of semiconductor SWCNTs present in a sample and measuring the relative integrated intensities of the PL peaks. The method can be extended to estimate the relative mass concentrations of semiconductor SWCNTs present in a sample from the measured values of the integrated intensities of the PL peaks and the knowledge of their PL cross section.
