Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17: 2015) (german version)

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films (IEC 62047-17: 2015) (german version)

Standard Number ÖVE / ÖNORM EN 62047-17: 2016 02 01
Organization Austrian Standards Institute Austria
Level National
Category Specification
Status
  • FEB 2016 Published
ABSTRACT
This part of IEC 62047 specifies the procedure for performing bulge tests (bulge / depth tests) on a free-standing layer that is curved within a window. The micro-sample is made from micro- / nano-layer materials, which include metal, ceramic or polymer layers for MEMS, microsystem or other components. The thickness of the layer is in the range from 0.1 μm to 10 μm and the width of the rectangular or square membrane window or the diameter of the circular membrane is in the range from 0.5 mm to 4 mm.