Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Measurements of charge carrier concentration

Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Measurements of charge carrier concentration

Standard Number PD IEC TS 62607-5-3:2020
Organization British Standards Institution UK
Level National
Category Test Method | Characterization | Measurement
Status
  • APR 2020 Published
ABSTRACT
IEC TS 62607-5-3:2020 specifies sample structures for evaluating a wide range of charge carrier concentration in organic/nano materials. This specification is provided for both capacitance-voltage (C-V) measurements in metal/insulator/semiconductor stacking structures and Hall-effect measurements with the van der Pauw configuration. Criteria for choosing measurement methods of charge carrier concentration in organic semiconductor layers are also given in this document.