| Standard Number | 113/598/NP |
|---|---|
| Organization |
British Standards Institution
|
| Level | National |
| Category | Test Method | Characterization | Measurement |
| Status |
|
This part of IEC 62607 establishes a standardized method to determine the key control characteristic order parameter for graphene-based material and common carbon materials by X-ray diffraction (XRD) and transmission electron microscope (TEM).
The order parameter is analysed from two perspectives: z-axis and x-y-axis. In z-axis the order parameter is derived from the full width at half maxima (FWHM) of Miller index (002) in XRD spectrum. In x-y-axis, it is derived from the FWHM of Miller index (100) corresponding to diffraction patterns obtained by SAED (selected area electron diffraction) technique, which is routinely performed on most of TEM in the world.
– The method is applicable for graphene-based material and carbon material including graphite, expanded graphite, amorphous carbon, glassy carbon, the structures of which are clarified by other characterization techniques.
– Typical application areas are classifying graphene-based material and carbon-related materials and differentiating graphene from graphite for manufactures and downstream users.
